High Fault Coverage Built-In Self-Test for 3 Generation Mobile Phone User

On-chip Built-In Self-Test (BIST) based implementation on RF devices especially on cellular mobile phone has been proposed. In this approach, high-level functional test can be done with one complete test path. Central baseband processor roles as Test Pattern Generator (TPG) as well as Output Response Analyzer so that it can generate test patterns through the complete path over the transceiver components and read the output back. In order to compensate the fact that a component level diagnosis is impossible with functional test if there are multiple components cascaded, we adopted the solution from one of the recent study which utilized embedded sensors to observe the each component behavior. Finally combining it with the functional test through the transceiver path brings a high fault coverage rate as well as an efficient test strategy for the mobile phone user.